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Kerns, R. D., 332 Kessler, L., 305 Kessler, R. C., 155 Keys, C. L. M., 133 Khan, K., 439 Khoo, G., 223 Kiecolt-Glaser, J. K., 158 Kiel, D. H., 366 Kiesler, C. A., 46, 56, 448 Kilbey, M. M., 25, 448, 451, 458 Kilburg, R. R., 383, 493, 496 Kim, K. M., 267 Kimberling, W. J., 339 King, A. C., 337 King, D. A., 351 King, L., 133 Kirk, S. A., 192 Kirmayer, L. J., 192 Kirsch, I., 310, 439 Kirschner, D. A., 146 Kirschner, S., 146 Kite, M. E., 378 Klausner, R. D., 170 Klein, M., 121, 267 Klein, R. G., 288, 433, 449 Klein, S., 420 Kleinke, C. L., 265, 267, 268, 305, 310, 311, 312, 313 Klepac, R. K., 70, 459 Klerman, G. L., 465 Klosko, J. S., 164 Klotz, M. L., 313 Klusman, L. E., 449 Kobasa, S. C., 330 Kobos, J. C., 438 Kohlbrenner, R. J., 247 Kohout, J., 445, 447, 453 Kohut, H., 122, 267 Kolko, D. J., 197 Kolodziej, M. E., 166, 168 Komatz, D., 408, 409 Koocher, G. P., 392, 402, 423 Koopman, C., 170 Kopelman, P. G., 328 Kopta, S. M., 305 Koran, L. M., 160 Korczyn, A. D., 346, 347 Koretz, G., 328 Korman, M., 60, 69 Kosinski, M., 574 Koss, M. P., 355

For example, an ERM can have a Weak ET participating in two Identifying RTs: if we try to represent this same concept using the UML notation for composition, we would try to model the same class (the Weak ET) as being a private part of two different parent classes at the same time, which is a completely different set of semantics for UML So, in this extreme scenario, we have a CDM that merely uses UML Classes instead of ETs, UML Member Properties instead of ATs, UML Inheritance instead of ITs, and UML Associations instead of RTs If we ignore all the other features, nuances, and semantics that UML has to offer, we can create a na ve UML rendition of a CDM For example, see Figure 105, for a na ve UML rendition of the same CDM that we looked at.

senting the number of channels in use. The state transition diagram is shown in Figure 1.4. The system model is modeled by a typical M/M/S/S queueing model. Let P(i) be the probability that the system is in state i. The probabilities P(i) can be determined in the usual way for birth death processes. From Figure 1.4, the state equilibrium equation is P(i) =

parameters degraded prior to the predicted level on the basis of the ESD HBM step-stress (e.g., the d.c. I V shift failure criteria) [8]. From this product level ESD stress study, the failure criteria of RF components must address evaluation of all the RF parametrics. Using the ESD test system for d.c. characterization, this study can be used to de ne the upper limit of the second RF characterization study. As was done in the single component ESD study, a relationship does exist between the d.c. characterization and the RF degradation. First, in both cases, RF degradation does occur prior to full ESD failure based on a d.c. parameter. In the single component case, a clear relationship was established between transistor RF parameter degradation and the d.c. shift of the forward bias voltage (e.g., in the emitter-base study). In this product level study, the upper level of HBM failure, based on a d.c. shift criteria, was used only as an upper limit to de ne the stress conditions for the second full RF evaluation. In the product evaluation, there are a signi cant number of RF parameterics, which is dependent on the product application. Hence, the method discussed is a useful method to utilize the commercial ESD testers and establish limits for the RF ESD evaluation [8].

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A second universal assumption regarding mental representation is the notion that new representations are inevitably formed by referencing memory for relevant prior experiences and knowledge It is quite obvious that we would be hopelessly disoriented and quickly incapacitated if we had to treat every stimulus that we encounter as a novel phenomenon about which no preconceptions are available Instead, we rely on our memories to determine such crucially important matters as how to interpret the meaning of different objects and events and how to allocate our attention to different aspects of the social environment As such, our experience of the present is always inexorably linked to past experiences, as they are represented in memory.